Microelectronics failure analysis : desk reference / edited by the Electronic Device Failure Analysis Society, Desk Reference Committee.
2004
TK7871 .M52 2004
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Details
Title
Microelectronics failure analysis : desk reference / edited by the Electronic Device Failure Analysis Society, Desk Reference Committee.
ISBN
9781615032662 (electronic bk.)
1615032665 (electronic bk.)
9780871708045
0871708043
1615032665 (electronic bk.)
9780871708045
0871708043
Imprint
Materials Park, Ohio : ASM International, ©2004.
Language
English
Description
1 online resource (xiv, 800 pages) : illustrations
Call Number
TK7871 .M52 2004
System Control No.
(OCoLC)297826771
Bibliography, etc. Note
Includes bibliographical references and indexes.
Formatted Contents Note
Introduction
Failure analysis process flow
Failure verification
Failure mode: failure classifications
Special devices
Non-destructive analysis techniques
Depackaging
Photon emission (electroluminescence) localization techniques
Microthermography
Laser and particle beam-based localization techniques
Deprocessing
General imaging techniques
Local deprocessing and imaging
Materials analysis techniques
Important topics for semiconductor devices
FA techniques/tools roadmaps
FA operation and management
Appendix.
Failure analysis process flow
Failure verification
Failure mode: failure classifications
Special devices
Non-destructive analysis techniques
Depackaging
Photon emission (electroluminescence) localization techniques
Microthermography
Laser and particle beam-based localization techniques
Deprocessing
General imaging techniques
Local deprocessing and imaging
Materials analysis techniques
Important topics for semiconductor devices
FA techniques/tools roadmaps
FA operation and management
Appendix.
Source of Description
Print version record.
Added Corporate Author
Available in Other Form
Print version: Microelectronics failure analysis. Materials Park, Ohio : ASM International, ©2004
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